{"id":5474,"date":"2023-01-04T13:51:49","date_gmt":"2023-01-04T13:51:49","guid":{"rendered":"http:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/?page_id=5474"},"modified":"2026-01-03T23:03:20","modified_gmt":"2026-01-03T21:03:20","slug":"lem","status":"publish","type":"page","link":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/lem\/","title":{"rendered":"Electron Microscopy"},"content":{"rendered":"\n
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Laboratory Equipment<\/h1>\n\n\n\n

Scanning Electron Microscopes<\/strong><\/h2>\n\n\n\n
\"Jeol<\/figure>
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Jeol JSM-IT200 InTouchScope\u2122 Scanning Electron Microscope<\/h3>\n\n\n\n

Routine, easy to use 0.5-30kV SEM, SE detector, BSE detector, 5 axis stage.<\/p>\n\n\n\n

Location:<\/strong> room S40<\/p>\n<\/div><\/div>\n\n\n\n

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Jeol JSM-IT800 Schottky Field Emission Scanning Electron Microscope<\/h3>\n\n\n\n

HR SEM, in chamber SEI detector, Low vacuum SEI detector, BSE retractable detector + BSE LV mode, STEM detector DF + BF, colour CCD camera for airlock + stage navigation system, array tomography + correlative SW, 5 axis motorized stage.<\/p>\n\n\n\n

Location:<\/strong> room S006<\/p>\n<\/div>

\"\"<\/figure><\/div>\n\n\n\n
\n\n\n\n

Transmission Electron Microscopes<\/strong><\/h2>\n\n\n\n
\"\"<\/figure>
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Jeol JEM-1011 TEM<\/h3>\n\n\n\n

Routine 100 kV TEM equipped with a Veleta CCD camera<\/p>\n\n\n\n

Location:<\/strong>\u00a0room S45<\/p>\n<\/div><\/div>\n\n\n\n

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Other Equipment<\/h1>\n\n\n\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\"Bal-Tec\n\t\t\t\t<\/picture>\n\t\t\t\t
<\/div>\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\tBal-Tec Critical point dryer CPD 030\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t
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\n\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\"Bal-Tec\n\t\t\t\t<\/picture>\n\t\t\t\t
<\/div>\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\tBal-Tec Sputter coater SCD 050\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t
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\n\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\"Leica\n\t\t\t\t<\/picture>\n\t\t\t\t
<\/div>\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\tLeica EM AMW – Automatic Microwave Tissue Processor for Electron Microscopy\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t
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\n\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\"Leica\n\t\t\t\t<\/picture>\n\t\t\t\t
<\/div>\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\tLeica EM AFS2 – Freeze Substitution System\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t
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\n\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\"Jeol\n\t\t\t\t<\/picture>\n\t\t\t\t
<\/div>\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\tJeol JEE-420 vacuum evaporator\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t
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\n\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\n\t\t\t\t\t\"Ultramicrotome\n\t\t\t\t<\/picture>\n\t\t\t\t
<\/div>\n\t\t\t\t\t\t\t\t\t\t\t
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\n\t\t\t\t\tUltramicrotome Reichert-Jung Ultracut E\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t\t\n\n\n
    \n
  • Leica AT-4 diamond knife with accessories for array tomography cutting, Diatome diamond knives,
    Knife makers LKB 7801A , Reichert-Jung.<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

    Laboratory Equipment Scanning Electron Microscopes Jeol JSM-IT200 InTouchScope\u2122 Scanning Electron Microscope Routine, easy to use 0.5-30kV SEM, SE detector, BSE detector, 5 axis stage. Location: room S40 Jeol JSM-IT800 Schottky Field Emission Scanning Electron Microscope HR SEM, in chamber SEI detector, Low vacuum SEI detector, BSE retractable detector + BSE LV mode, STEM detector DF + […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_uag_custom_page_level_css":"","footnotes":""},"class_list":["post-5474","page","type-page","status-publish","hentry"],"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"trp-custom-language-flag":false,"wpsso-schema-1x1":false,"wpsso-schema-4x3":false,"wpsso-schema-16x9":false,"wpsso-thumbnail":false,"wpsso-opengraph":false,"wpsso-tc-summary":false,"wpsso-tc-lrgimg":false},"uagb_author_info":{"display_name":"admin","author_link":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/author\/admin\/"},"uagb_comment_info":0,"uagb_excerpt":"Laboratory Equipment Scanning Electron Microscopes Jeol JSM-IT200 InTouchScope\u2122 Scanning Electron Microscope Routine, easy to use 0.5-30kV SEM, SE detector, BSE detector, 5 axis stage. Location: room S40 Jeol JSM-IT800 Schottky Field Emission Scanning Electron Microscope HR SEM, in chamber SEI detector, Low vacuum SEI detector, BSE retractable detector + BSE LV mode, STEM detector DF +…","_links":{"self":[{"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/pages\/5474","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/comments?post=5474"}],"version-history":[{"count":6,"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/pages\/5474\/revisions"}],"predecessor-version":[{"id":6763,"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/pages\/5474\/revisions\/6763"}],"wp:attachment":[{"href":"https:\/\/web.natur.cuni.cz\/sekce-bi\/VMCF\/wp-json\/wp\/v2\/media?parent=5474"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}